Definition: Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM is instrumental in the analysis and ...

Scanning Tunneling Microscopy is a subset of Scanning Probe Microscopy (SPM), a group of techniques that image and manipulate surfaces at the nanometer to atomic scales. SPM techniques share the ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...

Three powerful options are available with Bruker for performing electrochemical (EC) scanning probe microscopy: Electrochemical Scanning Tunneling Microscopy (ECSTM), Electrochemical Atomic Force ...

A geared stepper motor attached to the probe platform is set up to allow ... Continue reading “Building A 3D Printed Scanning Tunneling Microscope” → ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale. The unit houses two scanning electron microscopes, two scanning probe microscopes and ...

Before arriving at Janelia three years ago, Postdoctoral Scientist Antonio Fiore was designing and building optical ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...

Microscopy refers to any method used to acquire ... or through the use of a physical scanning probe that measures one of a wide range of different sample characteristics.